| 影响沉银表面变色问题关键因素的分析 |
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| 引用本文： | 陈黎阳,乔书晓.影响沉银表面变色问题关键因素的分析[J].印制电路信息,2010(Z1):34-38. |
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| 作者姓名： | 陈黎阳 乔书晓 |
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| 作者单位： | 深圳市兴森快捷电路科技股份有限公司 |
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| 摘 要： | 文章旨在于通过田口-DOE实验法来探讨回流焊过程中银面变色的问题,以期在PCB制作流程中寻找某些关键因素来优化流程控制,最终提高沉银层抗变色的能力。并尝试通过XPS等一些测试方法来分析银层厚度对银面变色问题的影响及其内在原因。
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| 关 键 词： | DOE 沉银 变色 XPS |
The signifi cant factors analysis for IMS surface discolour problem |
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| CHEN Li-yang,QIAO Shu-xiao.The signifi cant factors analysis for IMS surface discolour problem[J].Printed Circuit Information,2010(Z1):34-38. |
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| Authors: | CHEN Li-yang QIAO Shu-xiao |
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| Institution: | CHEN Li-yang QIAO Shu-xiao |
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| Abstract: | This article aims to research the problem of IMS surface discolor after reflow by Taguchi DOE., with a view to find some significant factors to optimize PCB process control and ultimately improve the capacity of IMS resisted discoloration. And try to analyze the impact of IMS thickness on discolor problem by XPS and related test. |
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| Keywords: | DOE XPS |
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