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Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films |
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| Authors: | Bart Boschmans Myriam Vanneste Eef Temmerman Luc Van Vaeck |
| Institution: | a Department of Chemistry, University of Antwerp (CDE), Universiteitsplein 1, B-2610 Wilrijk, Belgium b Centexbel, Technologiepark 7, B-9052 Zwijnaarde, Belgium c University of Ghent, Department of Applied Physics, Rozier 44, B-9000 Ghent, Belgium |
| Abstract: | Time-of-Flight (TOF) static secondary ion mass spectrometry (S-SIMS) was used to gain molecular information on the surface modifications introduced by plasma treatment of polypropylene (PP) films. A procedure using slotted electron microscopy grids was developed to deal with the charge build-up of samples with a thickness of about 30 μm. The surface composition was studied as a function of the plasma treatment time. A comparison of the mass spectra from untreated and treated PP showed significant differences of signal intensities of ions that could be specifically related to the presence of oxygen-containing species. |
| Keywords: | TOF S-SIMS Atmospheric plasma Polypropylene Charge build-up Surface modification |
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