PLA-PMMA blends: A study by XPS and ToF-SIMS |
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Authors: | D Cossement R Gouttebaron P Viville R Lazzaroni |
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Institution: | a Laboratoire de Chimie Inorganique et Analytique, Materia Nova, Site Initialis, 1 Avenue Nicolas Copernic, B-7000 Mons, Belgium b Laboratoire de Chimie des Matériaux Nouveaux, Materia Nova, Site Initialis, 1 Avenue Nicolas Copernic, B-7000 Mons, Belgium |
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Abstract: | This paper reports which are the possibilities of quantification by time of flight secondary ion mass spectrometry (ToF-SIMS) for some polymer blends. In order to assess the composition of the mixtures, we studied first different poly(l-lactide)/polymethylmethacrylate (PLA/PMMA) blends by X-ray photoelectron spectroscopy (XPS), this technique being quantitative. By XPS fitting of the C 1s level, we found a very good agreement of the measured concentrations with the initial compositions. Concerning ToF-SIMS data treatment, we used principal component analysis (PCA) on negative spectra allowing to discriminate one polymer from the other one. By partial least square regression (PLS), we found also a good agreement between the ToF-SIMS predicted and initial compositions. This shows that ToF-SIMS, in a similar way to XPS, can lead to quantitative results. In addition, the observed agreement between XPS (60-100 Å depth analyzed) and ToF-SIMS (10 Å depth analyzed) measurements show that there is no segregation of one of the two polymers onto the surface. |
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Keywords: | XPS ToF-SIMS PLA/PMMA blends PCA PLS regression Quantification |
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