SSIMS analysis of organics, polymer blends and interfaces |
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| Authors: | Lu-Tao Weng Chi-Ming Chan |
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| Institution: | a Materials Characterization and Preparation Facility, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
b Chemical Engineering Department, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China |
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| Abstract: | This paper gives a critical review on the applications of ToF SIMS in the areas of polymer additive characterization and in the study of polymer blends and interfaces. Polymer additives can readily be identified by ToF SIMS using their parent molecular ions or characteristic fragments. This analytical capability has been successfully applied to monitor the migration or segregation of additives during polymer processing. ToF SIMS is an ideal analytical tool for the study of polymer blends and interfaces because it is able to provide information on both surface composition and morphology. In combination with other analytical techniques such as AFM and XPS, ToF SIMS chemical imaging capability has opened up new horizons in the investigation of complex polymer blend systems. Finally the main advantages and limitations of ToF SIMS in these application areas are also discussed. |
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| Keywords: | ToF SIMS Additives Polymer blends Interfaces Surface composition Morphology |
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