Nanophotonics and nanometrology with planar X-ray waveguide-resonator |
| |
Authors: | V.K. Egorov E.V. Egorov |
| |
Affiliation: | IMT RAS, Chernogolovka, Moscow District 142432, Russia |
| |
Abstract: | The mechanism of X-ray waveguide-resonance propagation or the radiation superstream model, which can become the ground of X-ray nanophotonics, is discussed briefly. Some attention is devoted to features consideration of the simplest devices characterized by the waveguide-resonance transportation of X-ray beams. The experimental data showing the user possibilities of a simplest waveguide-resonators application for diffractometry are presented. We discuss the main reasons to improve the metrological characteristics for total reflection X-ray fluorescence (TXRF) analytical method in case when the target exciting beam is formed by a waveguide-resonator. Some problems appearing during the waveguide-resonator application are formulated. |
| |
Keywords: | Interference field of X-ray standing wave Total reflection X-ray fluorescence (TXRF) Planar X-ray waveguide-resonator (PXWR) |
本文献已被 ScienceDirect 等数据库收录! |