ToF-SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source |
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Authors: | Zhengmao Zhu Michael J Kelley |
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Institution: | a Department of Applied Science, College of William and Mary, Applied Research Center-601, 12050 Jefferson Aveneue, Newport News, VA 23606, United States b Free Electron Laser Department, Thomas Jefferson National Accelerator Facility, MS 6A, 12000 Jefferson Avenue, Newport News, VA 23606, United States |
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Abstract: | Cluster ions have been recognized as a superb primary species in time of flight secondary ion mass spectroscopy (ToF-SIMS) compared with monatomic primary ions, as they significantly enhance the secondary ion yields from bulk samples. Self-assembled monolayers provide an important system for studying the fundamental mechanism involved in the yield enhancement.We used a gold cluster ion source to analyze a new type of self-assembled monolayer: a fluorocarbon-grafted polyethylene terephthalate. In addition to the structure details, which helped to understand the grafting mechanism, ToF-SIMS analysis revealed that fluorocarbon secondary ion yield enhancements by cluster ions were due to the enhanced sputter efficiency. A larger information depth may also be expected from the enhancement. Both mathematical definitions of damage cross-section and disappearance cross-section were revisited under a new context. Another cross-section parameter, sputter cross-section, was introduced to differentiate the beam induced sputter process from damage process. |
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Keywords: | SIMS Cluster ion Polymer Monolayer Surface analysis Sputter cross-section |
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