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Recovery of single event upset in advanced complementary metal-oxide semiconductor static random access memory cells |
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| Authors: | Qin Jun-Rui Chen Shu-Ming Liang Bin Liu Bi-Wei |
| Affiliation: | College of Computer, National University of Defense Technology, Changsha 410073, China |
| Abstract: | |
| Keywords: | single event upset multi-node charge collection static random access memory angulardependence |
| 本文献已被 CNKI 维普 等数据库收录！ | |