| 电子装备测试性分析关键技术研究 |
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| 引用本文： | 李鸣,高娜,姜为学. 电子装备测试性分析关键技术研究[J]. 电光与控制, 2010, 17(11) |
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| 作者姓名： | 李鸣 高娜 姜为学 |
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| 作者单位： | 1. 军械工程学院,石家庄,050003
2. 桂林空军学院,广西,桂林,541001 |
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| 基金项目： | 军械工程学院科学研究基金项目 |
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| 摘 要： | 针对目前国内测试性分析的理论较杂,缺少综合、适用的分析系统的问题,研究了利用功能—行为—结构(FBS)模型描述测试性的技术,提出了基于故障模式、影响和危害性分析法,利用FBS模型进行测试性分析,构建了测试性层次型预计体系。
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| 关 键 词： | 故障测试 故障隔离 电子设备 测试性分析 测试性建模 |
Critical Technologies for Testability Analysis of Electronic Equipment |
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| LI Ming,GAO Na,JIANG Weixue. Critical Technologies for Testability Analysis of Electronic Equipment[J]. Electronics Optics & Control, 2010, 17(11) |
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| Authors: | LI Ming GAO Na JIANG Weixue |
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| Affiliation: | LI Ming1,GAO Na1,JIANG Weixue2(1.Ordnance Engineering College,Shijiazhuang 050003,China,2.Guilin Air Force College,Guilin 541001,China) |
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| Abstract: | The domestic theory of testability analysis is disorderly and unsystematic,and there isn't an integrated and applicable analysis system for use.The technology describing testability information by using Function-Behavior-Structure(FBS) model was studied.And the method that use FBS relational database model was put forward for testability analysis based on Failure Mode,Effects and Criticality Analysis(FMECA) method,and a hierarchy system for testability anticipation was built up. |
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| Keywords: | fault test fault isolation electronic equipment testability analysis testability modeling |
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