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多步退火对(Pb,La)(Zr,Ti)O_3反铁电厚膜的影响
引用本文:杜妙璇,耿文平,丑修建,张文栋.多步退火对(Pb,La)(Zr,Ti)O_3反铁电厚膜的影响[J].微纳电子技术,2012,49(4):263-267,279.
作者姓名:杜妙璇  耿文平  丑修建  张文栋
作者单位:中北大学电子与计算机科学技术学院仪器科学与动态测试教育部重点实验室,太原,030051
基金项目:国家自然科学基金资助项目(51175483);山西省高等学校优秀青年学术带头人-人才支持计划资助项目(晋教科[2010]4号);山西省基础研究计划资助项目(20100210023-6)
摘    要:采用溶胶-凝胶技术,在Pt(111)/Ti/SiO2/Si(100)基底上制备Pb0.97La0.02(Zr0.95Ti0.05)O3反铁电厚膜材料,研究了单步和多步退火工艺对反铁电厚膜结构及电学性能的影响。结果表明:与传统的单步退火方式相比,多步退火工艺制备的反铁电厚膜材料晶粒尺寸较大,结构致密性好,室温下反铁电态更稳定,具有良好的择优取向度(100)、较高的介电常数(达529)和饱和极化强度(达42μC/cm2)。其反铁电-铁电和铁电-反铁电的相变电场强度分别为198和89 kV/cm,反铁电-铁电相变电流密度达2×10-5 A/cm2,多次退火工艺可提高反铁电厚膜的成膜质量。

关 键 词:溶胶-凝胶  反铁电厚膜  退火工艺  微观结构  电学特性

Effects of Multi-Step Anneal on (Pb,La) (Zr,Ti)O3 Antiferroelectric Thick Films
Du Miaoxuan , Geng Wenping , Chou Xiujian , Zhang Wendong.Effects of Multi-Step Anneal on (Pb,La) (Zr,Ti)O3 Antiferroelectric Thick Films[J].Micronanoelectronic Technology,2012,49(4):263-267,279.
Authors:Du Miaoxuan  Geng Wenping  Chou Xiujian  Zhang Wendong
Institution:(Key Laboratory of Instrumentation Science & Dynamic Measurement,Ministry of Education,College of Electronics and Computer Science and Technology,North University of China,Taiyuan 030051,China)
Abstract:Pb0.97La0.02(Zr0.95Ti0.05)O3 antiferroelectric thick films were deposited on Pt(111)/Ti/SiO2/Si(100) substrates by the sol-gel method.The effects of single-step and multi-step annealing procedures on the structure and electrical properties of antiferroelectric thick films were stu-died.The analysis result indicates that compared to those prepared with the conventional single-step annealing process,the antiferroelectric thick films prepared by the multi-step annealing treatment show bigger grain size,better crack-free structure,more stable antiferroelectricity at room temperature,better(100)-preferred orientation,higher dielectric constant(up to 529) and saturation polarization(up to 42 μC/cm2).The electric fields of their antiferroelectric-ferroelectric(AFE-FE) and FE-AFE phase transitions are 198 and 89 kV/cm,respectively.The current density of AFE-FE phase transition can reach 2×10-5 A/cm2.These results indicate that the antiferroelectric thick film quality is improved with the multi-step annealing treatment.
Keywords:sol-gel  antiferroelectric thick film  annealing treatment  microstructure  electrical property
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