首页 | 本学科首页   官方微博 | 高级检索  
     

基于Talbot-Moiré法测量透镜焦距的CCD亚像素标定技术
引用本文:吴玲玲,吴国俊,仓玉萍,陈良益. 基于Talbot-Moiré法测量透镜焦距的CCD亚像素标定技术[J]. 光子学报, 2014, 39(10): 1896-1900. DOI: 10.3788/gzxb20103910.1896
作者姓名:吴玲玲  吴国俊  仓玉萍  陈良益
作者单位:(1 中国科学院西安光学精密机械研究所,西安 710119)
(2 中国科学院研究生院,北京 100049)
(3 西安工业大学 光电工程学院 测控技术与仪器系,西安 710032)
基金项目:中科院"西部之光"人才培养计划"西部博士资助项目"资助
摘    要:利用Ronchi光栅的Talbot效应和Moiré条纹测量长焦透镜焦距,根据焦距与莫尔条纹斜率之间的定量关系可求得透镜焦距.分别采用Canny算子和形态学方法对光栅的栅线中心进行像素级定位,再用高斯曲线拟合对其进行亚像素定位.经过对标准条纹的标定,验证了该方法的条纹中心定位误差小于0.1个像素.采用光栅作为系统的自基准对CCD像素当量进行了亚像素标定,为条纹斜率和宽度的计算提供了可靠的测量基准,经过计算,采用这些数据计算的焦距误差为0.10%.

关 键 词:   焦距测量  Talbot效应  莫尔条纹  亚像素  标定
收稿时间:2009-12-18

Sub Pixel Calibration of Measuring Focal Length of Lens Based on Talbot-Moiré
WU Ling-ling,WU Guo-jun,CANG yu-ping,CHEN Liang-yi. Sub Pixel Calibration of Measuring Focal Length of Lens Based on Talbot-Moiré[J]. Acta Photonica Sinica, 2014, 39(10): 1896-1900. DOI: 10.3788/gzxb20103910.1896
Authors:WU Ling-ling  WU Guo-jun  CANG yu-ping  CHEN Liang-yi
Affiliation:(1 X i′an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi′an 710119,China)
(2 Graduate University of Chinese Academy of Sciences,Beijing 100049,China)
(3 Department of Measurement and   |Control Technology and Instrumentation,School of Optoelectronic Engineering
Xi’an Technological University,Xi′an 710032,China)
Abstract:The focal length of measured lens can be figured out accurately according to its relation to the slope coefficient of Moiré fringes.An approach is presented to determine the location of grating centre at the level of pixel by Canny operator and detection based on mathematical morphology.The sub pixel localization is presented based on Gauss curve fitting.The localization accuracy is proved less than 0.1 pixel by calibrating the standard fringes.Then the grating is set as the reference to calibrate the equivalent length of CCD pixel to ensure the slope and width measuring of fringes accurate.The error of focal length is 0.10%.
Keywords:Focal length measurement  Talbot effect  Moiré  fringes  Sub pixel  Calibration
点击此处可从《光子学报》浏览原始摘要信息
点击此处可从《光子学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号