| 用共线光热偏转技术测量光学薄膜的微弱吸收 |
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| 引用本文： | 吴周令 唐晋发. 用共线光热偏转技术测量光学薄膜的微弱吸收[J]. 光学学报, 1990, 10(2): 34-138 |
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| 作者姓名： | 吴周令 唐晋发 |
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| 作者单位： | 中国科学院上海光学精密机械研究所，浙江大学光仪系，浙江大学光仪系 杭州，杭州 |
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| 摘 要： | 用具有高灵敏的共线光热偏转技术研究SiO_2、ZrO_2、MgF_2、ZnS等单层光学薄膜的吸收特性,测得它们的吸收率.实验结果与激光量热法及横向光热偏转技术符合良好,表明共线光热偏转技术是测量光学薄膜弱吸收的较理想方法.
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| 关 键 词： | 光热偏转法 薄膜 光学 吸收特性 |
| 收稿时间： | 1988-04-05 |
Measurement of weak absorption of optical coatings by collinear photothermal deflection technique |
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| WU ZHOULING. Measurement of weak absorption of optical coatings by collinear photothermal deflection technique[J]. Acta Optica Sinica, 1990, 10(2): 34-138 |
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| Authors: | WU ZHOULING |
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| Abstract: | Weak absorption of optical coatings is measured by collinear photothermal deflection spectroscopy with a sensitivity as high as 10-6. The experimental results are in good agreement with those measured by a laser calorimeter and those by the tran verse photo thermal deflection method. |
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| Keywords: | photothermal deflection speotrosoopy weak absorption. |
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