On the determination of scale and temperature factors in crystal structure analysis

The treatment is described for placing the relative intensities of X-ray diffractions on the absolute scale and for simultaneously determining the temperature factor. It is based on similar principles as the exact procedure given by Kartha for the determination of the scale factor but has the advantage that its use is not limited by the a priori knowledge of the temperature factor. The present relations can be transformed into Wilson's well-known statistical treatment by introducing certain approximations. This enables the reliability of Wilson's method to be discussed.