| Abstract: | ![]()
A new linked scan is described by which fragmentations occurring in the second field free region of a two sector instrument can be monitored. The scan can be used only if the first stage allows selection of ions according to their masses. The magnetic sector and electric sector are scanned in unison so that the product B2E is maintained constant. A spectrum of all parents of a preselected daughter ion is obtained and the resolution depends only on the mass resolution of the magnetic sector. |
