| Abstract: | Two types of films showing different characteristic x-ray equatorial patterns were prepared from chloroform and N,N-dimethylformamide solutions of poly(γ-methyl L -glutamate-co-γ-benzyl L -glutamate). In the film cast from chloroform solution, the x-ray pattern on the equator consisted of a remarkable mixture of sharp and diffuse reflections, with the sharp reflections corresponding to integral values of 1/3k. On the other hand, in the film cast from N,N-dimethylformamide solution, a well-defined x-ray pattern was observed. An explanation for this characteristic pattern of chloroform-cast film was made on the basis of a structural model wherein stacking faults or dislocations are incorporated into the ordered structure characteristic of N,N-dimethylformamide-cast film. Two domains divided by a stacking fault are mutually displaced along the (100) crystal planes, but the shape and size of the unit cell is everywhere the same. The intensity distribution of x-ray diffraction was calculated as a function of the probability of a stacking fault occurring in a regular sequence of (100) planes. The best correspondence with observation was obtained with a stacking fault in every three layers, on the average. |
