X-ray photoelectron spectroscopic analysis of oxidized Fe-16Cr-16Ni-2Mn-1Mo-2Si austenitic stainless steel |
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| Authors: | James A. Poston Jr. Ranjani V. Siriwardane D.E. Alman |
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| Affiliation: | a Surface Science-Materials R&D Group, National Energy Technology Laboratory, U.S. Department of Energy, 3610 Collins Ferry Road, P.O. Box 880, Morgantown, WV 26507-0880, United States
b Albany Research Center, National Energy Technology Laboratory, U.S. Department of Energy, 12450 Queen Avenue, SW, Albany, OR 97321-2198, United States |
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| Abstract: | Depth profile analysis (argon ion etching/X-ray photoelectron spectroscopy) was conducted on a series of Fe-16Cr-16Ni-2Mn-1Mo-2Si austenitic stainless steel samples oxidized at 973 and 1073 K with exposure times of 25, 100, 193, 436 and 700 h. Surface and near surface rearrangement following oxidation resulted in a region of high Cr concentration on all oxidized samples. Temperature and time dependence to O2 penetration depth was observed. In general, O2 penetration depth was found to increase with increasing exposure up to 436 h. No increase in depth was observed between 436 and 700 h exposure time. |
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| Keywords: | Austenitic stainless steel alloys High temperature stainless steels Oxidation Oxidation resistance Depth profile |
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