Stabilization in electrical characteristics of hydrogen-annealed ZnO:Al films |
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Authors: | Byeong-Yun Oh |
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Institution: | Information and Electronic Materials Research Laboratory, Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-Dong, Seodaemun-Gu, Seoul 120-749, Republic of Korea |
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Abstract: | Al-doped ZnO (ZnO:Al) films prepared by RF magnetron co-sputtering at room temperature were thermally treated in hydrogen ambient at 300 °C to enhance the films’ characteristics for transparent conductive oxide applications. The electrical properties of the hydrogen-annealed films were improved and preserved in air ambient, even though the crystal structures of the films were not changed by the thermal treatment. The optical and oxygen bonding characteristics of ZnO:Al films manifested that absorbed oxygen species on the films were removed by the hydrogen-annealing process. These results supported that the development of the electrically reliable ZnO:Al films could be realized using the hydrogen-annealing process. |
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Keywords: | 73 61 Ga 73 61 &minus r 81 65 &minus b 68 43 &minus h 79 60 &minus i |
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