Study on the reflectivity properties of spherically bent analyser crystals

Theoretical and experimental studies are presented on properties of spherically bent analyser crystals for high‐resolution X‐ray spectrometry. A correction to the bent‐crystal strain field owing to its finite surface area is derived. The results are used to explain the reflectivity curves and anisotropic properties of Si(660) and Si(553) analysers in near‐backscattering geometry. The results from the calculation agree very well with experimental results obtained using an inelastic X‐ray scattering synchrotron beamline.