The nature of a defective layer in samples of molecularly doped polymers

The shape of time-of-flight curves in the mode of subsurface irradiation of samples with lowenergy electrons is analyzed for free-standing films of a typical molecularly doped polymer of different thicknesses (11?C45 ??m). Special attention is paid to comparison of curves registered for both sides of the samples. The data confirm the hypothesis that the defective layer is formed owing to sublimation of dopant molecules during sample preparation and qualitatively agree with predictions of the two-layer multiple-trapping model.