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Investigations of C60 molecules deposited on Si(111) by noncontact atomic force microscopy
Authors:Kei Kobayashi   Hirofumi Yamada   Toshihisa Horiuchi  Kazumi Matsushige
Affiliation:

Department of Electronic Science and Engineering, Kyoto University, Kyoto, 606-8501, Japan

Abstract:We demonstrated the high resolution imaging of the organic molecules using noncontact atomic force microscopy in ultrahigh vacuum. The sample was C60 molecules deposited on the Si(111)-7×7 reconstructed surface. When the thickness of the C60 film was submonolayer, we could image some isolated C60 molecules and the reconstructed Si surface simultaneously. However, the imaging was highly unstable not only because of the large structure but also due to the large difference between the interaction forces on the molecules and on the Si surface. On the other hand, when the thickness of the C60 molecules was almost monolayer, individual molecules could be stably imaged.
Keywords:Fullerene   Organic molecules   Atomic force microscopy
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