Extremely long range surface polaritons in a thin corrugated metal film

The essential increase of propagation length of a long range surface plasmon polariton in a thin symmetrically corrugated plasmon-carrying film embedded in a dielectric medium is theoretically predicted. The calculations are based on the differential formalism for the system of Maxwells equations where the solution for electromagnetic fields is written as a superposition of partial plane waves in the presentation of a curvilinear non-orthogonal coordinates system for simplifying the boundary conditions. The spectral and angular dependencies of p-polarized light transmittance/reflectance demonstrate that the in-plane shift between both profiles of corrugated film drastically changes the surface plasmon polariton propagation length from minimum of the asymmetric profile to maximum of the symmetric one. The obtained results were qualitatively explained using the model of weakly coupled photonic wells.