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A technique to assess the reliability of the second-order susceptibility determination of thin films |
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| Authors: | Mikael Siltanen Martti Kauranen |
| Affiliation: | Optics Laboratory, Institute of Physics, Tampere University of Technology, P.O. Box 692, 33101 Tampere, Finland |
| Abstract: | |
| Keywords: | Non-linear optics Second-harmonic generation Susceptibility Thin films |
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