Comparison of the background corrected valence band XPS spectra of Fe and Co aluminides and silicides with their electronic structures |
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Authors: | Masaoki Oku Toetsu ShishidoHideyuki Matsuta Kazuaki Wagatsuma |
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Institution: | Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai 980-8577, Japan |
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Abstract: | The background corrected valence band XPS spectra and the electronic structures of FeAl, FeSi, CoAl and CoSi were studied. Clean surfaces of the polycrystalline samples were obtained by in situ fracturing of the samples in an XPS spectrometer. The energy loss parts of the Fe 2p, Co 2p and valence band spectra were removed by the deconvolution method using Al 2s or Si 2s spectra as response functions. CoAl exhibited a satellite peak in the Co 2p region, but the other compounds had no clear satellite peaks in the Co 2p and Fe 2p regions. The experimentally background corrected valence band spectra were compared with the calculated spectra using the first-principle band calculation. There were large discrepancies between the spectra above the binding energy of 5 eV. These indicated that the experimental spectra could not be explained by the electronic structures of the ground states alone. |
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Keywords: | FeAl FeSi CoAl CoSi Valence band XPS spectra Electronic structure |
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