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Structure of crystalline and amorphous Ge probed by X-ray absorption and diffraction techniques |
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| Authors: | A. Di Cicco E. Principi M. Minicucci S. De Panfilis A. Filipponi F. Decremps |
| Affiliation: | 1. Istituto Nazionale di Fisica della Materia, INFN-LNF and Dipartimento di Fisica , Università di Camerino , Via Madonna delle Carceri, 62032, Camerino (MC), Italy andrea.dicicco@unicam.it;3. Istituto Nazionale di Fisica della Materia, INFN-LNF and Dipartimento di Fisica , Università di Camerino , Via Madonna delle Carceri, 62032, Camerino (MC), Italy;4. ESRF , B.P. 220 38043, Grenoble Cedex, France;5. INFM, Università dell'Aquila, Dip. di Fisica , via Vetoio, 67010, Coppito, L'Aquila, Italy;6. LURE and Laboratoire de Physique des Milieux Condensés , Université Pierre et Marie Curie T13 E4 , 4 place Jussieu, F-75252, Paris Cedex 05, France |
| Abstract: | Results of experiments dedicated to the study of the structure under high pressure of amorphous Ge (a-Ge) and crystalline Ge (c-Ge) are reported. Energy-dispersive X-ray diffraction measurements of c-Ge have been collected at the DW11A beamline (DCI, LURE) using a heatable diamond anvil cell as pressure device up to 500?K. The a-Ge measurements have been performed at the ESRF, using the advanced set-up available at the BM29 beamline, which allows the simultaneous collection of X-ray absorption spectroscopy data and diffraction patterns used to monitor pressure and crystallization of a sample in a Paris–Edinburgh large-volume cell. The new structural data allowed us to obtain a reliable determination of the lattice parameters as a function of pressure and temperature in c-Ge and of the first-neighbor distance distribution in a-Ge. |
| Keywords: | X-ray absorption spectroscopy EXAFS X-ray diffraction Amorphous materials Structure Phase transitions |