Rietveld analysis for energy dispersive x-ray diffraction under high pressure with synchrotron radiation |
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| Authors: | H W Neuling W B Holzapfel |
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| Institution: | Fachbereich Physik , Universit?t-GH-Paderborn , Postfach Paderborn, 16210-4790 , Germany |
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| Abstract: | Abstract A new program has been developed for the conversion of energy-dispersive x-ray diffraction spectra obtained from powder samples at high pressure in a diamond anvil cell (DAC) into conventional pseudo angle-dispersive data. The program is compatible with a conventional Rietveld program. This allows the determination of the structural parameters of the samples investigated. Results of a synchrotron radiation study of polycrystalline SrFCl in the tetragonal phase at high pressure are presented. Presented at the IUCr Workshop on ‘Synchrotron Radiation Instrumentation for High Pressure Crystallography’, Daresbury Laboratory 20-21 July 1991 |
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