Effects of Uniaxial Stress on X-ray Diffraction Spectra

Uniaxial stress is a typical drawback of solid pressure transmitting medium, at low temperature, which affects experimental spectra by shifting and broadening the diffraction peaks. Corrections to this effects have been proposed in the past only for the systematic shifts. We presented a simple model based on elasticity theory which rationalizes both peak shifts and broadening observed in X-ray diffraction. Our results are compared to the popular Singh model.