| 微通道板表面发雾的AES分析 |
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| 引用本文： | 刘术林,张海峰.微通道板表面发雾的AES分析[J].应用光学,1993,14(6):25-29. |
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| 作者姓名： | 刘术林 张海峰 |
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| 作者单位： | 西安应用光学研究所，西安应用光学研究所，中国船舶工业总公司七二五所，中国船舶工业总公司七二五所 |
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| 摘 要： | 应用俄歇电子能谱对微通道板表面发雾区域进行分析。分析结果表明,发雾区碳含量比正常区高三倍。由此可推测出,发雾是由碳污染引起的,而这种碳污染很可能是残留于微通道板上的某些有机物在烧氢时碳化所致。
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| 关 键 词： | 微通道板 碳污染 俄歇电子谱法 |
ANALYSIS OF MICROCHANNEL PLATE FOGGING SURFACE BY AUGER ELECTRON SPECTROSCOPY |
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| Liu Shulin Zhang Jisheng.ANALYSIS OF MICROCHANNEL PLATE FOGGING SURFACE BY AUGER ELECTRON SPECTROSCOPY[J].Journal of Applied Optics,1993,14(6):25-29. |
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| Authors: | Liu Shulin Zhang Jisheng |
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| Abstract: | Auger electron spectroscopy (AES) is used to analyze the micro- channel plate foggiug surface in this paper.The anlysis results show that a carbon content in the fogging area is three times higher than that in the normal area.From this,we draw a conclusion that the fogging results from the carbon contamination,and this kind of carbon contamination is likely to that some organic compounds remained in the microchannel plate are carbo- nated during the hydrogen firing. |
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| Keywords: | Auger electron spectroscopy microchannel plate carbon contamination |
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