Orientation control of ferroelectric polymer molecules using contact-mode AFM

We have developed an orientation control technique for polymer molecules utilizing contact-mode atomic force microscopy (AFM). In this technique, the molecular chains were directly modified by scanning an AFM cantilever tip in contact with the film surface at the temperature just below its melting point. We call this process “modification scan”. Here, we applied this technique to poly(vinylidenefluoride-trifluoroethylene) (P(VDF-TrFE)) thin films on graphite and glass. We prepared a 75-nm thick copolymer crystalline film on graphite whose lamellar plane was perpendicular to the substrate (edge-on), and also prepared a film of the same thickness on glass whose lamellar plane was parallel to the substrate (flat-on). After applying this technique on both films, molecular chains were stretched and aligned to the modification scan direction, and new edge-on crystals were obtained, whose lamellar planes were well-aligned perpendicular to the modification scan direction.