A time-of-flight spectrometer for angle-resolved detection of low energy electrons in two dimensions |
| |
| Authors: | PS Kirchmann L Rettig D Nandi U Lipowski M Wolf U Bovensiepen |
| |
| Institution: | 1.Laboratoire Hubert Curien (ex-LTSI), UMR 5516,Université Jean Monnet,Saint-Etienne,France;2.Ecole Nationale Supérieure des Mines de Saint-Etienne, Centre SMS – URA CNRS 5146,Saint-Etienne Cedex 02,France;3.Laboratoire de Géologie,Ecole Normale Supérieure de Paris,Paris Cedex 05,France;4.Laboratoire de Physique du Solide, UPR5 CNRS-ESPCI,Paris Cedex 05,France;5.Laboratoire Interfaces et Systèmes Electrochimiques, CNRS-UPR 15, Boite courrier 133,Université Pierre et Marie Curie Paris VI,Paris Cedex 05,France |
| |
| Abstract: | We have developed a time-of-flight photoelectron spectrometer that simultaneously analyzes low energy electrons photoemitted
from solid surfaces in an energy- and angle-resolved manner. To achieve this, a field free drift tube with an acceptance angle
of 22° is combined with two-dimensional position-sensitive detection of photoelectrons, which is realized by a microchannel
plate stack and a delay-line anode for position encoding. Here, we present the design considerations and principles of operation
including analysis of multiple events per light pulse. The performance of the spectrometer is demonstrated by photoemission
from a Cu(111) single crystalline surface by UV femtosecond laser pulses at 6.2 eV photon energy.
PACS 71.20.-b; 73.20.At; 78.47.J-; 79.60.-i |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
