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Extended synchrotron X-ray reflectivity study of a Sm-based layer buried into CdTe(001)
Institution:1. CEA, Département de Recherche Fondamentale sur la Matière Condensée / SP2M / PI, 38054 Grenoble Cedex 9, France;2. CEA, Département de Recherche Fondamentale sur la Matière Condensée / SP2M / S, 38054 Grenoble Cedex 9, France;3. CNRS, LEPES, BP 166, 38042 Grenoble Cedex 9, France;1. Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Japan;2. School of Metallurgy and Environment, Central South University, Changsha, China;1. School of Nursing, Yale University, Orange, Connecticut;2. Department of Family Medicine and Population Health, Virginia Commonwealth University, Richmond, Virginia;3. Center for Evidence and Practice Improvement, Agency for Healthcare Research and Quality, Rockville, Maryland;4. School of Nursing, University of Wisconsin-Madison, Madison, Wisconsin;5. Office of the Provost, University of Iowa, Iowa City, Iowa;6. Departments of Medicine, Cardiology, and Psychiatry, Columbia University Medical Center, New York, New York;7. Department of Family Medicine and Community Health, University of Pennsylvania Perelman School of Medicine, Philadelphia, Pennsylvania;8. Department of Family and Community Medicine, Virginia Tech Carilion School of Medicine, Roanoke, Virginia;9. Pima County Department of Health, Tucson, Arizona;10. Department of Environmental and Occupational Health, Milken Institute School of Public Health, George Washington University, Washington, District of Columbia;11. Departments of Family Medicine and Health Sciences, School of Medicine and School of Public Health, University of Washington, Seattle, Washington;12. Department of Internal Medicine, Dell Medical School, University of Texas at Austin, Austin, Texas;13. Department of Family Medicine and Community Health, John A. Burns School of Medicine, University of Hawaii, Honolulu, Hawaii;14. Office of Communications, Agency for Healthcare Research and Quality, Rockville, Maryland
Abstract:We present an extended X-ray reflectivity study of a Sm-based epitaxial layer buried into CdTe(001) in order to investigate its structure. The measured reflectivity is modelled over a wide range of momentum transfer and the adjustment of the calculated intensity gives quantitative information about the electron density and interplanar distance profiles along the surface normal. Complementary experiments of photoemission spectroscopy allow the interpretation of the in-plane electron density in terms of chemical composition. High resolution electron microscopy shows that the very strong chemical gradients deduced from the model result from an original topology of the layer.
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