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Photon-bunching Effect from Two PDC Process
作者姓名:LIU  Bi-heng  SUN  Fang-weng  HUANG  Yun-feng  GUO  Guang-can
作者单位:Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China
基金项目:本文受到浙江省自然科学基金Y404355的支助.在此表示感谢.
摘    要:前期的研究表明,光子晶体带隙的大小与材料的介电常数关系紧密。而EIT材料实现改变材料介电常数的性质可以促使光子晶体光子带隙与EIT研究的有机结合,可以产生可调控的光子晶体带隙结构。

关 键 词:光子聚束效应  PDC进程  刺激发射  H-O-M干涉

Photon-bunching Effect from Two PDC Process
LIU Bi-heng SUN Fang-weng HUANG Yun-feng GUO Guang-can.Photon-bunching Effect from Two PDC Process[J].Acta Sinica Quantum Optica,2006,12(B08):38-38.
Authors:LIU;Bi-heng;SUN;Fang-weng;HUANG;Yun-feng;GUO;Guang-can
Abstract:We investigate the photon-bunching effect from two PDC process, and point out that the effect can be predicted by H-O-M interference and stimulation emission, then we give the way to distinguish these two thoeries using high order photon correlation. We also observe the different photon-bunching phenomenon experimentally, and the result fits our theory well.
Keywords:
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