A low cost uncooled focal plane array test system |
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| Authors: | Yingwen Li Xinjian Yi Zhaoxiang He Yan Luo |
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| Institution: | a Optoelectronic Engineering Department, Huazhong University of Science and Technology, Wuhan, Hubei 430074, People's Republic of China;b National Laser Technology Laboratory of China, Wuhan, Hubei 430074, People's Republic of China;c Institute of Patter Recognition and Artificial Intelligence, Wuhan, Hubei 430074, People's Republic of China;d Wuhan Material Protection and Research Institute, Wuhan, Hubei 430030, People's Republic of China |
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| Abstract: | The commercial test equipments from Pulse Instruments, Lumitron and Electro Optical Industries Inc. are very expensive. So, we proposed a new method of very low cost test system for testing the non-uniformity and signal/noise (S/N) and other characteristics of the uncooled focal plane array (UFPA). It uses complex programmable logic device to generate the necessary pulse for the UFPA and the low noise low dropout micropower regulator to obtain the low noise bias. A proportional-integral-differential controlled thermal electrical cooler based on micro-processor unit stabilizes the UFPA. The National Instruments 6111E Data Acquisition Card is used to convert the analog output of UFPA into digital signal into computer. Its 12-bits conversion capability provides sufficient accuracy for evaluating the S/N ratio and non-uniformity of 128×128 pixels UFPA. Labview is used to analyze the signal. The instrument is fast and convenient to adapt the system to other types of UFPA. Further discussion is presented to determine factors that affect the accuracy of the tester. |
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| Keywords: | Infrared Imager Tester |
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