Study of Ag/Si(111) submonolayer interface: II. Atomic geometry of Si(111) (√3 × √3 )R30°-Ag surface |
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| Authors: | S Kono H Sakurai K Higashiyama T Sagawa |
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| Institution: | Department of Physics, Faculty of Science, Tohoku University, Sendai 980, Japan |
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| Abstract: | Final state diffraction of Ag 3d X-ray photoelectrons from the Si(111) (√3 × √3)R30°-Ag surface has been measured. From a kinematical analysis of the diffraction patterns, it is found that a buried honeycomb framework of Ag atoms is formed on the surface with lateral displacement of the first Si layer. |
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