Relationship between field shift and phase constant change in two-dimensional three-layered dielectric or hollow waveguides due to uniform bends

It is shown theoretically that the field shift x and phase constant change in two-dimensional three-layered dielectric or hollow waveguides bent uniformly with large bending radiusR are related by x = 2R/ ₀, where ₀ is the axial phase constant. The relationship predicts that the field distributions of the TE₀ or TM₀ mode shift toward the outward direction of bending, whereas those of other TE _n or TM _n (n=1,2,...) modes shift inward in a hollow waveguide. Characteristic features in dielectric waveguides are also described.