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Influence of Polarization of Exciting X-Radiation on Sensitivity of Energy Dispersive X-Ray Fluorescence Trace Analysis at Rocks and Soils
Authors:M Brumme  J Heckel  K Irmer
Abstract:The application of polarized X-rays in energy dispersive X-ray fluorescence analysis (EDXRF) is prooved to be one method for improvement the sensitivity of trace analysis at rock- and soil-samples. The use of a high power X-ray tube in connection with an amorphous Barkla-scattering target for polarization makes possible the increase of peak-to-background ratios in a wide energy range (5 keV < E < 40 keV) in comparison to direct excitation. The influence of the polarization on the peak-to-background ratios at trace analysis at geological samples will be shown.
Keywords:X-ray fluorescence analysis  trace analysis  X-ray spectra  polarization  geology  soils  sensitivity
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