Influence of Polarization of Exciting X-Radiation on Sensitivity of Energy Dispersive X-Ray Fluorescence Trace Analysis at Rocks and Soils |
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Authors: | M Brumme J Heckel K Irmer |
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Abstract: | The application of polarized X-rays in energy dispersive X-ray fluorescence analysis (EDXRF) is prooved to be one method for improvement the sensitivity of trace analysis at rock- and soil-samples. The use of a high power X-ray tube in connection with an amorphous Barkla-scattering target for polarization makes possible the increase of peak-to-background ratios in a wide energy range (5 keV < E < 40 keV) in comparison to direct excitation. The influence of the polarization on the peak-to-background ratios at trace analysis at geological samples will be shown. |
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Keywords: | X-ray fluorescence analysis trace analysis X-ray spectra polarization geology soils sensitivity |
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