Analyse of Corrections during Measurements of Charge of a Semiconductor Detector |
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Authors: | B. Ćirilov M. Šmelcerović |
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Abstract: | The amplitude of signals coming from a semiconductor detector depends on the a amplifier system filter networks, detector physical properties and energy of particles measured. The absolute measuring of detector charge requires an analysis of the influence of the mentioned parameters upon the measuring system reaction. The paper gives the theoretical concepts and correction diagrams for the optimum filter networks of CR-RC and CR-(RC)2 tapes taking into consideration the existence of an undesirable integrating constant of the charge sensitive preamplifier. The application of the presented diagrams increases the accuracy and helps checking the obtained results by a pulse generator. |
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Keywords: | correction factors radioactivity measurement radiation detectors semiconductor detectors |
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