Structural phase modification in Cu incorporated nanostructured zinc sulfide thin films |
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| Institution: | 1. Sakarya Üniversitesi, Fen-Edebiyat Fakültesi, Fizik Bölümü, 54187 Adapazarı, Turkey;2. Sakarya Üniversitesi, BIMAYAM Biyomedikal, Manyetik ve Yarıiletken Malzemeler Araştırma Merkezi, 54187 Sakarya, Turkey;3. School of Physics, University of Exeter, Stocker Road, Exeter EX4 4QL, UK;1. Department of Chemistry, K. N. Toosi University of Technology, P. O. Box 15875-4416, Tehran, Iran;2. Computational Physical Sciences Research Laboratory, School of Nano-Science, Institute for Research in Fundamental Sciences (IPM), P.O. Box 19395-5531, Tehran, Iran;3. Chemical Physics Theory Group, Department of Chemistry, University of Toronto, 80 Saint George Street, Toronto, Ontario, Canada, M5S 3H6;1. Department of Chemistry and Biochemistry, University of Nevada Las Vegas, Las Vegas 89154-4003, USA;2. Department of Physics and Astronomy, University of Nevada Las Vegas, Las Vegas 89154-4003, USA;3. High Pressure Science and Engineering Center, University of Nevada Las Vegas, Las Vegas 89154, USA;1. Institut de Chimie et des Matériaux Paris-Est, GESMAT, UMR 7182 CNRS-Université Paris Est Créteil, 2, Rue Henri-Dunant, 94320 Thiais, France;2. Institut de Chimie et des Matériaux Paris-Est, SPC, UMR 7182 CNRS-Université Paris Est Créteil, 2, Rue Henri-Dunant, 94320 Thiais, France;3. Institut Charles Gerhardt Montpellier AIME, UMR 5253 CNRS-Université Montpellier 2, Place Eugène Bataillon, 34095 Montpellier, France;4. Université d’Evry Val d’Essonne, Département de Chimie, Bd François Mitterrand, 91025 Evry Cedex, France;5. ISIS Facility, STFC Rutherford Appleton Laboratory, Harwell Oxford, Didcot, Oxfordshire OX11 OQX, UK;6. Centre National d’Etudes Spatiales, 18 Avenue Edouard Belin, 31401 Toulouse Cédex 9, France |
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| Abstract: | Cu incorporated zinc sulfide (ZnS) films are prepared by a RF magnetron sputtering technique and the influence of Cu doping concentration on the structural, morphological and optical properties is systematically analyzed using techniques like grazing incidence X-Ray diffraction (GIXRD), micro-Raman spectroscopy, atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), energy dispersive X-ray spectroscopy (EDS) and UV–vis spectroscopy. XRD examination of the as-prepared films revealed the presence of polycrystalline structure with co-existence of cubic and hexagonal phases in the pure and lower Cu incorporated films. Increase in Cu doping concentration causes a gradual phase transformation from mixed phase to cubic phase. Micro-Raman spectra further confirms the structural phase modifications with the addition of Cu in ZnS. Morphological analysis shows compact distribution of elongated grain geometry with good connectivity and detectable grain boundary in the pure and Cu incorporated films. Increase in Cu incorporation results in the systematic reduction of RMS surface roughness. EDS analysis confirms the incorporation of Cu and surface vacancy defects in the doped films. All the films are transparent in the visible region and band gap calculation by Tauc plot shows that increase in Cu incorporation results in band gap renormalization. |
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| Keywords: | Copper incorporated zinc sulfide films Phase transformation Surface optical phonon Band gap renormalization Localized energy states |
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