Residual stress distribution on surface-treated Ti-6Al-4V by X-ray diffraction |
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| Authors: | S A Martinez S Sathish M P Blodgett M J Shepard |
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| Institution: | (1) Air Force Research Laboratory, Wright Patterson Air Force Base, Dayton, Ohio, USA;(2) University of Dayton Research Institute, 300 College Park, Dayton, Ohio, USA |
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| Abstract: | The x-ray diffraction technique has been used to measure surface residual stress in Ti-6Al-4V samples subjected to shot peening
(SP), laser shock peening (LSP) and low plasticity burnishing (LPB). The magnitude, spatial and directional dependence and
uniformity of the surface residual stresses have been investigated. The results show that residual stresses due to SP are
uniform and independent of direction. LSP has been observed to produce non-uniform residual stress varying from one region
to another, and also within a single laser shock. In the case of LPB, residual stresses have uniform spatial distribution
but have been observed to be direction-dependent. Various components of the residual stress tensor in the LPB sample have
been determined following the Dolle-Hauk method. The results of the residual stress due to three surface treatments are compared,
and possible reasons for spatial and directional dependence are discussed. |
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| Keywords: | X-ray diffraction residual stress shot peening laser shock peening low plasticity burnishing |
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