Oxygen depletion in electron beam bombarded glass surfaces studied by XPS |
| |
Authors: | Orazio Puglisi Giovanni Marletta Alberto Torrisi |
| |
Affiliation: | Istituto Dipartimentale di Chimica e Chimica Industriale, Viale A. Doria 6, 95125 Catania, Italy |
| |
Abstract: | XPS has been utilized to study the compositional changes which occur in glass after electron beam irradiation. In the bombarded surfaces a reduction in Na and O signals is observed, while Ca signal shows negligible variations. Two O1s signals, assigned to bridging and non-bridging oxygen were found. Irradiation causes a decrease of these two types of oxygen. This is at variance with Lineweaver's mechanism which accounts for the decrease of the non-bridging oxygens only. After irradiation a second component in the Si2p line is found. It has been attributed to the formation of SiSi bonds induced by oxygen outgassing. The formation of these bonds leads to a more compact structure and this might explain the observed density change in irradiated glass. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |