| 一种基于V58300平台的集成电路功能测试系统设计 |
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| 引用本文： | 田 强,杨婉婉,李力南,郭 刚,蔡 莉,刘海南,罗家俊.一种基于V58300平台的集成电路功能测试系统设计[J].太赫兹科学与电子信息学报,2021,19(3):537-540. |
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| 作者姓名： | 田 强 杨婉婉 李力南 郭 刚 蔡 莉 刘海南 罗家俊 |
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| 作者单位： | 1.School of Electronic and Information Engineering，Beijing Jiaotong University，Beijing 100044，China；2a.Institute of Microelectronics；2b.Key Laboratory of Silicon Device Technology，Chinese Academy of Sciences，Beijing 100029，China;3.Department of Nuclear Physics, China Institute of Atomic Energy，Beijing 102413，China；4.Radiation Application Technology Innovation Center of National Defense Technology Industry，Beijing 102413，China |
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| 基金项目： | 国防科技工业抗辐照应用技术创新中心创新基金资助项目(KFZC2018020301) |
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| 摘 要： | 基于中科院微电子所自主研发的V58300硬件平台，设计实现了一种集成电路功能测试系统。该系统包含上位机与下位机两部分，通过在上位机实时更改测试系统相关I/O的定义和输入的测试向量文件，即可自动完成对各种运行频率在25 MHz及以下，I/O数量在48位及以下双列直插(DIP)封装集成电路的功能测试，实现了测试系统的通用化和低成本化。最后通过实验证明本测试系统可以有效地对相关芯片进行功能测试。
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| 关 键 词： | 现场可编程门阵列 集成电路测试 测试向量 功能测试 |
| 收稿时间： | 2019/10/24 0:00:00 |
| 修稿时间： | 2019/12/11 0:00:00 |
Design of an integrated circuit function test system based on V58300 platform |
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| TIAN Qiang,YANG Wanwan,LI Linan,GUO Gang,CAI Li,LIU Hainan,LUO Jiajun.Design of an integrated circuit function test system based on V58300 platform[J].Journal of Terahertz Science and Electronic Information Technology,2021,19(3):537-540. |
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| Authors: | TIAN Qiang YANG Wanwan LI Linan GUO Gang CAI Li LIU Hainan LUO Jiajun |
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| Abstract: | Based on the V58300 hardware platform independently developed by the Institute of Microelectronics of the Chinese Academy of Sciences, an integrated circuit function test system is designed and implemented. The system includes two parts: host computer and slave computer. By changing the definition of the I/O related to the test system and the input test vector file in real time on the host computer, the functions test of Dual In-line Packaged(DIP) integrated circuits with various operating frequencies of 25 MHz and below and I/O numbers of 48 and below can be automatically completed. The system realizes the universalization and low cost of the test system. Finally, it is proved that the test system can effectively test related chips by experiments. |
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