| Abstract: | A combination of optical and atomic force microscopy (AFM) is used for probing changes in the morphology of polymer blend films that accompany phase ordering processes (phase separation and crystallization). The phase separation morphology of a “model” semi‐crystalline (polyethyleneoxide or PEO) and amorphous (polymethylmethacrylate or PMMA) polymer blend film is compared to previous observations on binary amorphous polymer blend films of polystyrene (PS) and polyvinylmethylether (PVME). The phase separation patterns are found to be similar except that crystallization of the film at high PEO concentrations obscures the observation of phase separation. The influence of film defects (e.g., scratches) and clay filler particles on the structure of the semi‐crystalline and amorphous polymer films is also investigated. |
