Phase transition properties of ferroelectric thin films with two surface layers |
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Authors: | Yang Xiong Lu Cheng |
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Institution: | a Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065, China b International Centre for Materials Physics, Academia Sinica, Shenyang 110016, China |
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Abstract: | The phase diagrams of ferroelectric thin films with two surface layers described by the transverse Ising model have been studied under the mean-field approximation. We discuss the effects of the exchange interaction and transverse field parameters on the phase diagrams. The results indicate that the phase transition properties of the phase diagrams can be greatly modified by changing the transverse Ising model parameters. In addition, the crossover features of the parameters from the ferroelectric dominant phase diagram to the paraelectric dominant phase diagram are determined for ferroelectric thin films with two surface layers. |
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Keywords: | 68 60 -p 75 10 Hk 77 80 Bh |
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