Measurements of someK-internal conversion coefficients near threshold

TheK-internal conversion coefficients have been measured by the XPG technique for a number of low energyγ-ray transitions whose energies do not exceed theK-binding energies by more than 4 keV. Using Si(Li) detectors in singles and coincidence arrangements, the following results were obtained: 63.1 keV El in¹⁶⁹Tm(α_K=1.02±0.15), 72.0 keV E1 in¹⁸⁷Re (0.75±0.05), 57.8 keV M1 in¹⁶²Ho (11.42±0.67), 56.6 keV M1 in¹⁶⁴Ho (12.04±0.70), and 67.1 keV M1 in¹⁷⁴Lu(10.25±0.58). The experimental results are compared with the theoretical calculations which include transition energies down to 1 keV above threshold.