Characterization of second and third order optical nonlinearities of ZnO sputtered films |
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Authors: | MC Larciprete D Haertle A Belardini M Bertolotti F Sarto P Günter |
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Institution: | 1. Dipartimento di Energetica, INFM at Università di Roma “La Sapienza”, Via A. Scarpa, 16-00161, Rome, Italy 2. Nonlinear Optics Laboratory, Institute of Quantum Electronics, ETH H?nggerberg, 8093, Zürich, Switzerland 3. Dipartimento di Fisica, Rome, Italy and Università di Roma Tre, Rome, Italy 4. Division of Advanced Physics Technologies, ENEA, Via Anguillarese, 301-00060, Rome, Italy
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Abstract: | We measured the second and third order optical nonlinearity of zinc oxide, grown on glass substrates by the ion beam sputtering
technique. Second and third harmonic generation measurements were performed by means of the rotational Maker fringes technique
for different polarization configurations, thus allowing the determination of all non-zero components of the second order
susceptibility at three different fundamental beam wavelengths, i.e., 1064 nm, 1542 nm and 1907 nm. The dispersion of the
nonlinear optical coefficients has been evaluated, while the nonlinear optical coefficients were found to range between 0.9 pm/V
and 0.16 pm/V for d33, 0.53 pm/V and 0.08 pm/V for |d15|, 0.31 and 0.08 pm/V for |d31|, with increasing wavelength. Finally, one third order susceptibility, χijkl
(3), has been determined by third harmonic generation measurements at a fundamental wavelength λ=1907 nm and a value for χ3333
(3) of 185×10-20 m2/V2 has been found.
PACS 42.65.An; 42.65.Ky; 42.70.Nq |
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