Investigation of the trap state of Sr2MgSi2O7: Eu2+, Dy3+ phosphor and decay process

The thermoluminescence glow curves of Sr₂MgSi₂O₇: Eu²⁺, Dy³⁺ phosphor were measured after various delay times. A single trap center is confirmed that conforms to a kinetics model with order greater than 1, leading to a suppression of TL intensity and a high temperature shift of the TL peak with longer delay times. A constant trap depth supports this phenomenon. Further, the decay curve of the afterglow and the change in initial trapped carrier concentration can be fitted using general-order kinetics and the fitting results show that the afterglow is close to a second-order kinetics process, which implies that most of the released carriers are retrapped.