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Energy surfaces of rare-earth silicide films on Si(1 1 1)
Authors:M. Wanke, M. Franz, M. Vetterlein, G. Pruskil, B. H  pfner, C. Prohl, I. Engelhardt, P. Stojanov, E. Huwald, J.D. Riley,M. D  hne
Affiliation:aTechnische Universität Berlin, Institut für Festkörperphysik, D-10623 Berlin, Germany;bLa Trobe University, Department of Physics, Bundoora, Victoria 3083, Australia
Abstract:We report on angle-resolved photoelectron spectroscopy results of thin dysprosium-silicide layers formed on Si(1 1 1), taken with a toroidal analyzer allowing to image the energy surfaces in k||-space. At monolayer dysprosium coverages, where hexagonal DySi2 grows with a 1×1 superstructure, electron pockets are observed at the View the MathML source points with highly anisotropic effective masses, and around a hole pocket at the View the MathML source point also an anisotropic dispersion is found. The band filling of these two bands amounts to one, indicating an even number of electrons assigned to the surface unit cell. Similar features are found for multilayer coverages, where hexagonal Dy3Si5 layers are formed with a View the MathML source superstructure. Here, the influence of zone folding effects due to the View the MathML source reconstructed layers in the bulk silicide is only weak because of the high surface sensitivity of the experiments.
Keywords:Lanthanides   Silicides   Silicon   Thin film structures   Angle-resolved photoelectron spectroscopy
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