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Comparison of silicon LIII,II electron loss spectra and optical absorption
Authors:J.E. Rowe  S.B. Christman
Affiliation:Bell Laboratories, Murray Hill, New Jersey 07974, USA
Abstract:Threshold structure due to LIII,II excitation in the electron loss spectra of silicon at 100.2 ± 0.3 eV is in good agreement with optical absorption measurements of 100.1 ± 0.1 eV.
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