Low frequency coupling constants for Raman scattering in amorphous solids

Low frequency Raman scattering measurements in amorphous silicon indicate that the coupling constants. C^j. for both components of the Raman tensor vary as the square of the frequency. This result agrees with the model calculations of Whalley and Bertie for amorphous solids in the long wavelength limit. The frequency range of this behavior is found to be approximately that for which Debye-like behavior exists in the crystal.