|
|||||
|
|
X-ray study of GaAs/Ge heterostructures: relationship between interfacial defects and growth process |
|
| Authors: | M Putero N Burle C Pelosi C Frigeri E Chimenti N Guelton |
| Institution: | 1. CNRS URA 1530, Faculté des Sciences St-Jér?me, Laboratoire MATOP, 13397 Marseille, Cedex 20, France 2. CNR-MASPEC Institute, via Chiavari 18/A, 43100, Parma, Italy 3. IRSID, Voie Romaine, BP 320, 57214, Maizieres les Metz Cedex, France |
| Abstract: | |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ | |