Wavelength dispersive X-ray fluorescence imaging using a high-sensitivity imaging sensor |
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| Affiliation: | 1. Department of Applied Chemistry & Bioengineering, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan;2. X-ray Analysis Division, Rigaku Corporation, 14-8 Akaoji-cho, Takatsuki-shi, Osaka 569-1146, Japan;1. Université Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS, IRD, IFSTTAR, ISTerre, 38000 Grenoble, France;2. Université Côte d''Azur, CNRS, OCA, IRD, Géoazur, 250 rue Albert Einstein, Sophia Antipolis, 06560 Valbonne, France;3. Institute of Geological Sciences, University of Bern, Baltzerstrasse 1 + 3, CH3012 Bern, Switzerland;4. Géosciences Montpellier, UMR 5243, Université Montpellier & CNRS, Place Eugène Bataillon, 34095 Montpellier, France;5. Department of Earth Sciences, Durham University, Science Labs, Durham DH1 3LE, United Kingdom;1. Key Laboratory of Mineral Resources, Institute of Geology and Geophysics, Chinese Academy of Sciences, P.O. Box 9825, Beijing 100029, China;2. GeoZentrum Nordbayern, Universität Erlangen-Nürnberg, Schlossgarten 5a, D-91054 Erlangen, Germany;3. The Seventh Geological Brigade of Xinjiang Bureau of Geology and Mineral Resources, Wusu 833000, China;1. University of Tennessee Space Institute, Mechanical, Aerospace, and Biomedical Engineering Department, Tullahoma, TN, United States;2. Energy Systems Division, Argonne National Laboratory, Lemont, IL, United States;3. Materials Science Division, Argonne National Laboratory, Lemont, IL, United States;4. Materials Science and Engineering Department, Northwestern University, Evanston, IL, United States |
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| Abstract: | A new wavelength-dispersive X-ray fluorescence (WD-XRF) imaging spectrometer equipped with a high-sensitivity imaging sensor was developed in our laboratory. In this instrument, a straight polycapillary optic was applied instead of a Soller slit as well as a 2D imaging X-ray detector instead of X-ray counters, which are used in conventional WD-XRF spectrometers. Therefore, images of elemental distribution were available after a short exposure time. Ni Kα images and Cu Kα images were clearly obtained at corresponding diffraction angles for a short exposure time of 10 s. By optimizing the spectrometer, the time required for imaging is reduced, leading to XRF image movies. It is difficult to distinguish two peaks (Ti Kα (4.508 keV) and Ba Lα (4.465 keV)) due to the poor energy resolution of EDXRS. However, Ti and Ba images could be successfully observed by the WD-XRF imaging spectrometer. The energy resolution of the developed spectrometer was 25 eV at the Ti Kα peak. |
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