Abstract: | In the present work the author describes a method for investigating phonon spectra of thin films of semiconductor solid solutions
that is based on reflection-absorption spectroscopy in the far IR region. Analysis of spectra is carried out for two radiation
polarizations (of the s- and p-type) and for the following experimental conditions: the spectral region 30–250 cm−1 and an angle of incidence of 45°. By comparing theoretical and experimental spectra for quaternary solid solutions of ZnxCdyHg1−x−yTe (ZCMT), the frequencies of LO- and TO-phonons are found and the three-mode behavior of the phonon spectra of ZCMT is established.
Reported at the Second International Scientific and Technical Conference on Quantum Electronics, Minsk, November 23–25, 1998.
Institute of Physics, Pedagogical University, 16A, Reitan Str., Rzeszów, 35–310, Poland. Translated from Zhurnal Prikladnoi
Spektroskopii, Vol. 66, No. 5, pp. 669–671, September–October, 1999. |